Scanning Electron microscopy (SEM) is able to provide extremely high resolution of samples at magnifications far beyond standard light microscopy. SMS Labs offers two state of the art machines that are both equipped with light element detection by energy dispersive x-ray spectroscopy (EDS). As configured, our instruments are able image in excess of 10,000x magnification as well as obtain micro-chemical spectra in extremely small regions not discernible by conventional chemical testing.
The data obtainable by SEM/EDS earns its reputation as the most valuable tool in failure analysis and metallographic investigations.
Download a Sample SEM-EDS Report Completed by Sturbridge Metallurgical Services
Fracture analysis (Fractography)
High magnification inspection – wear patterns, microcracks, material transfer
Particle Morphology and Powder Imaging
Determination of Chemical Composition
Residues & stains
Foreign object debris
EDS features include Micro Probing, X-Ray Mapping, and Line Scanning